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Measure Switching Currents in New Generation Power Semiconductors
Power Electronic Measurements Ltd will be demonstrating its full range of Rogowski technology based wide-bandwidth current probes. Featuring the latest CWT MiniHF, the company will demonstrate how this AC probe not only provides better common mode immunity to local high voltage transients, but also provides a more precise measurement delay which can be compensated for to give improved power loss measurement in power semiconductors using SiC and GaN. PCIM Booth 7-122
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Events  
Energy Storage ForumRome, ItalyApr 27 2015
CWIEMEBerlin, GermanyMai 05 2015
SMT HybridNuremberg, GermanyMai 05 2015
Power Analysis & DesignEching/ Munich, GermanyMai 06 2015
PCIM EuropeNuremberg, GermanyMai 19 2015
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